Institut für Oberflächen- und Schichtanalytik IFOS GmbH: Surface analysis – microscopic structures of great significance

 

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The Institute for Surface and Thin Film Analysis (IFOS) possesses many years of extensive expertise in the field of ma­­­­­te­­rial surfaces and thin film analysis. Whether in everyday life or in high tech­­­­­nology, sub-microscopic structures are everywhere. Wafer-thin films, such as that coated on the surface of spectacle lenses, plastic bottles or hard discs, are not detectable with the naked eye or even under the best light micro­­scope. The proper study of their chemical com­­­­position and structure is nev­­ertheless of great importance for progress in high technology.

An interdisciplinary team of scientists is examining the composition, the micro-mechanic characteristics as well as the structure of solid surfaces and thin-film systems. To determine the root causes of damages or defects in materials and components or to assist in the develop­­ment of new products and technologies the IFOS offers its users from industry, science and research direct access to the methods of instrumental surface and film analysis suitable to their particular requirements. The wide range of analytical services of the Institute constitutes an essential part of the tech­­­­nology infrastructure of the state of Rhineland-Palatinate.

 

Location of the IFOS GmbH in the  PRE UNI-Park, Kaiserslautern.

Location of the IFOS GmbH in the PRE UNI-Park, Kaiserslautern.

 


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  1. Adress

    Trippstadter Straße 120
    D-67663 Kaiserslautern
    Telefon +49 (0) 631 20573-0
    Telefax +49 (0) 631 20573-3003
    info(at)ifos.uni-kl.de
    www.ifos.uni-kl.de
    www.ifos-analytik.de
  2. Management

    Prof. Dr. Michael Kopnarski
  3. Year of establishment

    1999
  4. Employees

    25
  5. Business activity

    Research and development in the field of
    in­­­strumental surface and thin film analysis,
    service analysis and contract research in the field of product development,
    quality control and failure analysis