The Institute for Surface and Thin Film Analysis (IFOS) possesses many years of extensive expertise in the field of material surfaces and thin film analysis. Whether in everyday life or in high technology, sub-microscopic structures are everywhere. Wafer-thin films, such as that coated on the surface of spectacle lenses, plastic bottles or hard discs, are not detectable with the naked eye or even under the best light microscope. The proper study of their chemical composition and structure is nevertheless of great importance for progress in high technology.
An interdisciplinary team of scientists is examining the composition, the micro-mechanic characteristics as well as the structure of solid surfaces and thin-film systems. To determine the root causes of damages or defects in materials and components or to assist in the development of new products and technologies the IFOS offers its users from industry, science and research direct access to the methods of instrumental surface and film analysis suitable to their particular requirements. The wide range of analytical services of the Institute constitutes an essential part of the technology infrastructure of the state of Rhineland-Palatinate.
ManagementProf. Dr. Michael Kopnarski
Year of establishment1999
Research and development in the field of
instrumental surface and thin film analysis,
service analysis and contract research in the field of product development,
quality control and failure analysis